4 article(s) from Sweetman, Adam
Modelling of ‘sub-atomic’ contrast resulting from back-bonding on Si(111)-7×7
- Adam Sweetman,
- Samuel P. Jarvis and
- Mohammad A. Rashid
Beilstein J. Nanotechnol. 2016, 7, 937–945, doi:10.3762/bjnano.7.85
Nano-contact microscopy of supracrystals
- Adam Sweetman,
- Nicolas Goubet,
- Ioannis Lekkas,
- Marie Paule Pileni and
- Philip Moriarty
Beilstein J. Nanotechnol. 2015, 6, 1229–1236, doi:10.3762/bjnano.6.126
![[Graphic 1]](/bjnano/content/inline/2190-4286-6-126-i1.png?max-width=637&scale=1.18182)
= 20 pA, ...
Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces
- Adam Sweetman and
- Andrew Stannard
Beilstein J. Nanotechnol. 2014, 5, 386–393, doi:10.3762/bjnano.5.45
Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe
- Adam Sweetman,
- Sam Jarvis,
- Rosanna Danza and
- Philip Moriarty
Beilstein J. Nanotechnol. 2012, 3, 25–32, doi:10.3762/bjnano.3.3
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